ref: 7eaad70bf771e5e28f21863f6b316770f0779d24
parent: 74d47a8132288511be97a4d2326debd2fe0dc03b
author: Jingning Han <jingning@google.com>
date: Wed May 28 07:18:33 EDT 2014
Enable unit test for partial 16x16 inverse 2D-DCT This commit enables unit test for SSSE3 16x16 inverse 2D-DCT with 10 non-zero coefficients. It includes a new test condition to cover the potential overflow issue due to extremely coarse quantization. Change-Id: I945e16f05dfbe19500f0da5f15990feba8e26d99